September 19-20, 2018
SUNY Polytechnic Institute, ALBANY, N.Y.
Watch Keynotes and Sessions on SPM
Functional Graphene Oxide (GO) Templated Patterning and Anti-Microbial Properties
Dr. Rigoberto Advincula Case Western Reserve University
“Functional Graphene Oxide (GO) Templated Patterning and Anti-Microbial Properties”
Graphene (G), Graphene Oxide (GO), and Reduced Graphene Oxide (rGO) have had an explosive growth in their applications ranging from electronic devices to biomedical applications. The use of lithographic and non-lithographic patterning methods have enabled the unique applications of such materials in electronics, display devices, flexible electronics, sensors, etc.. This talk will highlight the preparation of patterned surfaces via templating and photo masking shows the versatility of GO electrochemistry and photochemistry in unique film applications. We also demonstrate their use in improving anti-microbial properties against known classes of pathogens. The use of silver nanoparticles and other metal particles for antimicrobials has been the dominant additive for coatings, textiles, and other devices. Here we demonstrate the use of GO and rGO additives for anti-microbial activity such as E. Coli and B. subtilis including mitigation biofilm formation on a host of substrates. These properties were observed on solution preparation, coatings, and electrodes that have been modified by polymerGO composites including preparation as fibers. Modification of graphene oxide further provides chemical functionality that is able to capture heavy metals for separations processes.
Measurement Challenges arising from New Semiconductor
Materials and Structures for Integrated Circuits
Dr. Alain Diebold SUNY Polytechnic Institute
“Measurement Challenges arising from New Semiconductor Materials and Structures for Integrated Circuits”
The main focus of Professor Diebold’s research is in the area of nanoscale metrology and materials science. Measurement of nanoscale films and structures requires a thorough understanding of the role of uniquely nanoscale phenomena on the properties of nanoscale semiconductors and metals.
Ultrathin layered materials studied by AFM and MFM
Dr. Gwo Ching Wang Rensselaer Polytechnic Institute
“Ultrathin layered materials studied by AFM and MFM”
Atomic force microscopy has proven records to examine surface morphology, layer spacing, thickness and roughness of various materials. In this talk applications using AFM and MFM to examine strain and magnetic properties of ultrathin materials will be presented. Halide perovskite MAPbBr3 is an emerging semiconducting material and can be grown heteroepitaxially on mica through van der Waals interaction.The AFM image of the Halide perovskite flakes show square holes in thick flakes and monolayer terraces (see Fig.1) but no holes in thinner flakes. This implies the flake maybe highly-strained in the thinner flake due to the soft Halide perovskite and the strain relaxes in the thicker flake to form holes. This is supported by significant strong blue shift of PL (2.44 eV) as the flake thickness decreases from bulk value (2.31 eV) . Thickness dependent Photoluminescence shift is related to the change of electronic band structure resultant from the material under strain. For the transition metal dichalcogenides VS2 it is predicted by density function theory to have room temperature magnetic moment in ultrathin regime and it has potential implementation in spintronics circuits and quantum computing devices. In collaboration with Park Scientific, the optical image (Fig. 2a), AFM image (Fig. 2b) and the dependence of MFM phase contrast (Fig. 2c) on sample-tip distance were collected at lift heights (L) from 20 nm to 50 nm(Figs. 2d-h). Qualitatively, a decrease in the interfacial contrast with an increase in L was observed (Fig.2i). The exponential decay of MFM phase shift with an increase in lift height likewise indicates an exponential decrease in attractive force between the tip and sample, consistent with what one would expect for a magnetic interaction. The observation of MFM phase signal reveals the existence of ferromagnetism in ultrathin VS2 consistent with density functional theory calculations.
Meeting the Challenges in Analyzing State-of-the-art Semiconductor Devices Using Scanning Probe Microscopy
Phil Kaszuba Global Foundries
“Meeting the Challenges in Analyzing State-of-the-art Semiconductor Devices Using Scanning Probe Microscopy”
In the late 1980s, the Scanning Probe Microscope (SPM) in its infancy was a complex, esoteric analytical instrument that had seen limited use in the semiconductor industry.
The SPM rapidly evolved into a mainstream analytical instrument in the early 1990s when companies like IBM and Intel boasted of their state of the art 0.5μm planar technologies. Proving itself with its unprecedented ability to “see” features on semiconductor devices like never before, the SPM quickly became established as a workhorse instrument in semiconductor device analysis. Early use was confined primarily to analytical laboratories; followed by a rapid progression into semiconductor device manufacturing lines for metrology applications.
The semiconductor industry has continually progressed, aggressively advancing the state of the art, which at present, is at full production of 3-dimensional devices, e.g., FinFETs at a critical dimension of 14nm. Analytical instrumentation has also, through necessity evolved to support the rapid advancement of the industry and the SPM has played an increasingly critical, supportive role in the development of new technologies, the monitoring of manufacturing processes, and the failure analysis of nanoscale semiconductor devices. A discussion of the challenges in performing critical analyses using SPM will be presented along with some recent results.
When glancing angle deposition meets with colloidal lithography …
Dr. Yiping Zhao University of Georgia
“When glancing angle deposition meets with colloidal lithography … ”
The combination of colloidal lithography and glancing angle deposition can facilitate a new powerful fabrication technique – shadow sphere lithography, which can greatly expand the variety and complexity of nanostructures fabricated using colloidal monolayer template. In this talk, I will discuss how to control the vapor flux and the colloidal template to design different kinds of three-dimensional optical metamaterials and two-dimensional metasurfaces.”
Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires
Dr. Ye Tao Rowland Institute at Harvard
“Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires”
Nanowires made of silicon are an emblem of the rise of nanotechnology and the emergence of a range of sensing modalities. In particular, the fields of chemical sensing and ultrasensitive force detection are two sub-fields that saw tremendous development in the past decade. In this talk, I will discuss two examples in which the mechanical and electrical properties of suspended single-crystal silicon nanowires are used to monitor chemical processes happening at the surface. In particular, we discover a new kinetic behavior in a solid-solid interface charge transfer reaction that is consistent with a microscopic model based on continuous interface inhomogeneities.
Quantitative Thermal Conductivity Analysis with Scanning Thermal Microscopy
Dr. Jiahua Zhu University of Akron
“Quantitative Thermal Conductivity Analysis with Scanning Thermal Microscopy”
As the development of the electronic and semiconductor industries quickens, thermal management in micro-devices becomes increasingly important. Among the various available thermal characterization technologies, scanning thermal microscopy (SThM) has the unique capability to probe thermal properties down to nanoscale because of its excellent spatial resolution. Currently, relative mapping of thermal conduction properties can be achieved, while a quantitative data analysis method is still not available to acquire absolute thermal conductivity. The main challenge is from the unpredictable heat flux across thermal tip/sample surface interface, which makes the thermal analysis very difficult. The heat flux can be affected by a variety of factors such as roughness, hardness, tip/surface contacting pressure, thermal conductivity of sample, etc. All these factors need to be considered to understand the heat transport across the contacting interface, which can be described as thermal contact resistance (TCR). Once TCR can be quantified, the heat transport from tip to sample surface can be systematically analyzed. So far, it remains a great challenge to characterize TCR not only because it is affected by many factors but also because the interplay of these factors is still not yet clear. Constructing TCR and SThM models and applying post-calibration could be a feasible strategy to correlate probe current and sample thermal conductivity.
In our group, a mathematical model was developed to describe TCR by considering the following parameters: probe current, sample thermal conductivity, sample surface roughness, sample surface slope and sample micro-hardness. Another two constants were also employed in this model: thermal tip radius and loading force of thermal tip during scanning. This model was derived based on the heat transfer mechanism between two solid surfaces. Based on the working principle of SThM with conductivity contrast mode, two mathematical models (linear for smooth surface and non-linear for rough surface) were developed to predict thermal conductivity with probe current reading. By combining TCR model and SThM measurement, the quantification of thermal conductivity becomes possible.
The Complex Polymers Beneath Your Feet
Dr. Nancy A. Burnham Worcester Polytechnic Institute
“The Complex Polymers Beneath Your Feet”
Modern economies are currently highly dependent on fossil fuels , yet typically only 30-50% of oil is recovered from reservoirs . Engineered nanoparticles  are being developed to better understand fluid flow within conventional reservoirs, which could lead to increased recovery if their adhesion to rock walls can be minimized . Moreover, in unconventional reservoirs the challenge of efficient oil recovery is dependent on the pore system of the kerogen, which is the main component of organic matter, along with the minerals that compose the rock matrix. It represents nanomaterial in the subsurface, the elastic modulus of which has been recorded as 10 GPa , while the remaining rock matrix can be up to ten times stiffer. Eventually, kerogen produces bitumen and finally oil. After extraction and refining it becomes the asphalt binder upon which you and I walk and drive. Both kerogen and asphalt binder (“bitumen”) can be thought of as complex polymers whose fascinating topography and chemo-mechanical properties are not well understood [5,6].In the case of asphalt binder, the challenge is to relate its complex chemistry to the durability of its long-term mechanical behavior in use as roads. Interestingly, however, room-temperature evolution of microstructures over a period of a few weeks was recently observed .In this talk, we will describe our contributions to addressing these societal problems by means of atomic-force microscopy. Better understanding of the source materials, the behavior of engineered nanoparticles within reservoirs, and a resulting every-day infrastructural material should lead to both more efficient fossil-fuel recovery and moredurablewalkways beneath your feet.
2D Materials in Real and Reciprocal Spaces:
Complimentary AFM and RHEED Studies
Yu Xiang RPI
van der Waals epitaxy of antimony on single-crystalline graphene
Xin Sun RPI
Quasi van der Waals epitaxy of copper thin film on monolayer graphene buffer
Zonghuan Lu RPI
Position-Specific Attachment of Nanoscale Samples
Kai Trepka Harvard
Investigation of “Artifact” Phenomenon in Scanning Thermal Microscopy (SThM)
Yifan Li University of Akron
A Suspended Graphene Sample Stage for Magnetic Resonance Force Microscopy