Speakers
Prof. Dr. Franz J. Gießibl
University of Regensburg Germany- Mysteries of the chemical bond revealed by atomic force microscopy
Prof. Dr. Lukas Eng
Technical University Dresden, Germany- Reconfigurable 2D Electron Gases in Ferroelectric Domain Walls
As. Prof. Kim McKelvey
Trinity College Dublin, Ireland- Correlated surface potential and electrochemical activity on 2D materials
Prof. Brian Rodriguez
University College Dublin, Ireland- AFM tip-induced strain effects in BiFeO3 films: from structural phase changes to polarization switching and nanofabrication
Prof. Silke Christiansen
Innovation-Institute for Technology and correlative Microscopy, Forchheim, Germany- Three-dimensional nano-architectures in energy, bio-medical, electronic and sensing applications – optimization based on correlative microscopy and spectroscopy and machine learning
Dr. Fatima Linares Ordonez
CIC, University of Granada, Spain- Characterization of metallo-DNA nanostructures properties with AFM
Prof. Ken Nakajima
Tokyo Institute of Technology, Japan- Nanorheological AFM for Basic Polymer Science
Dr. Reynier I. Revilla
Vrije Universiteit Brussel, Belgium- KPFM for electrochemical stydies: From corrosion to battery materials
Prof. Thorsten Hugel
University of Freiburg, Germany- Nanoscale characterization across several length scales by AFM and fluorescence microscopy
Prof. Dr. Christine Kranz
Ulm University, Germany- Hybrid electrochemical scanning probe microscopy: Physical and electrochemical characterization of interfaces
Dr. Neus Domingo
Catalan Institute of Nanoscience and Nanotechnology ICN2, Spain- Quantification of nanoscale electromechanical responses
Prof. Dennis Meier
NTNU – Norwegian University of Science and Technology, Norway- Advanced functionality in ferroelectric oxides - creating building blocks for nanoscale circuitry
Prof. Patrick R. Unwin
University of Warwick, United KingdomTo come
Dr. Sibylle Sievers
PTB - The National Metrology Institute of Germany- Traceably quantitative magnetic field measurements with magnetic force microscopy
