Special Guest Interview：
Co-Inventor of Conductive Atomic Force Microscopy
-Prof. Sean Joseph O’Shea， A*STAR, Singapore
Recent Trends in Characterization of Nanoelectronic Materials and Devices with Scanning Probe Microscopy
-Prof. Guenther Benstetter, Deggendorf Institute of Technology, Germany
Introduction of Recent SPM Hybrid Technology Development
-Dr. Sangjoon Cho, Park Systmes, Korea
Nanoscale Thermal Mapping of Electronic Devices
-Prof. Miguel Muñoz-Rojo, University of Twente, Netherlands
Conductive Atomic Force Microscopy of 2D Materials and Heterostructures for Nanoelectronics
-Dr. Filippo Giannazzo, National Research Council of Italy, Italy
Conduction Atomic Force Microscopy for Gate Dielectric Reliability Analysis
-Dr. Alok Ranjan, Singapore University of Technology and Design, Singapore
Calcium Fluoride: an Outstanding High-k Dielectric for 2D Electronics
-Ms. Chao Wen, Soochow University, China
(2020 Park AFM Scholarship Winner)
Live Demo:
A Comparative Study for Surface Potential Mapping Using KPFM
-Charles Kim, Park Systmes, Korea
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