Program

Join us for SPM technical sessions, hands-on, keynote addresses.



Day One, Tuesday November 19, 2019
NanoFab South Auditorium
8:00 am Breakfast
Morning Session
8:40 am Welcome
Keibock Lee, President, Park Systems
Featured Speakers
8:45 am Dr. Rigoberto Advincula, Professor,
Department of Macromolecular Science and Engineering, Case Western Reserve University; Research Professor, Department of Chemistry and
Chemical Engineering, University of Houston; Editor-in-chief, MRS Communications

“Nanostructured and Smart Interfaces”

9:15 am Dr. Ye Tao, Rowland Fellow, The Rowland Institute at Harvard

“Mirrors for Earth’s Energy Rebalancing (MEER:reflEction)”

9:45 am Prof. Jia Deng, Assistant Professor, Department of Systems Science and Industrial Engineering

“External Energy Assisted Nanomachining Using Soft AFM Probes”

10:15 am Morning Break – NanoFab South Rotunda
10:30 am Dr. Ji Ung Lee, Professor of Nanoscale Engineering, SUNY Polytechnic Institute

“2D Reconfigurable Devices”

11:00 am Phil Kaszuba, Senior Member of Technical Staff and Lead Engineer, Scanning Probe Microscopy (SPM) Laboratory, Global Foundries

“Scanning Capacitance Spectroscopy for Dopant Analysis on Nanoscale Semiconductor Devices”

11:30 am Dr. Lane Baker, James L. Jackson Professor of Chemistry, Indiana University

“Measuring Ions and Electrons with Nanoscale Pipettes”

12:00 pm LUNCH – NanoFab South Rotunda
Afternoon Session
1:00 pm Dr. Jin-Woo Han, Scientist, USRA Research Institute for Advanced Computer Science, NASA Ames Research Center

“Nanoscale Vacuum Channel Transistor on Silicon and Silicon Carbide”

1:30 pm Dr. Martin Edwards, Research Assistant Professor, Department of Chemistry, University of Utah

“Nanoscale Electrochemical Imaging”

2:00 pm Dr. Nathaniel Cady, Professor, Colleges of Nanoscale Science & Engineering, SUNY Polytechnic Institute

“Probing the Intersection of Nanotechnology and Biology”

2:30 pm Afternoon Break – NanoFab South Rotunda
Oral Presentations
2:45 pm Vineet Khullar, University of Tennessee-Knoxville
Nanoscale Measurements of Optical Properties Using Surface Plasmon Tunneling
3:00 pm Xin Ning, Rensselaer Polytechnic Institute
Nanoparticle Assembly Through Polyethylene Crystallization
3:15 pm Leo Sifringer, The Rowland Institute at Harvard
Electron-beam machining with sub-atomic depth resolution
3:30 pm Jun Liu, University at Buffalo
SPM Study of Tribo-Photovaltaic Effect in Metal/Semiconductor Moving Contacts
3:45 pm James Olson, Rensselaer Polytechnic Institute
Digital Twin Microscopy: A Conceptual Model for Sub-Nanoscale Exploration
4:00 pm Hoa Le, The Rowland Institute at Harvard
3D Nanoscaffold Cantilevers for Potential Applications in High-Speed Wafer-Scale Imaging
4:15 pm Jake Rabinowitz, Colombia University
Nanoscale SICM Under Concentration Gradients
4:30 pm Fanny Hiebel, Harvard University
Towards the demonstration of epitaxy from supra-atomic-resolution images
4:45 pm Theo Borca-Tasciuc, Rensselaer Polytechnic Institute
Quantitative Temperature Distribution Measurements by Non-Contact Scanning Thermal Microscopy Using Wollaston Probes Under Ambient Conditions
5:00 pm Zachary Hallenbeck, Rensselaer Polytechnic Institute
Super-Resolution Fluorescence Lifetime Microscopy for Probing Plasmonic Emission Rate Enhancement on the Nanoscale
5:15 pm Fang Xu, Harvard University
Probe Dynamics At Atomic Level: In Situ Non-Uniform Reaction Rates During Oxidation of Low-Chain Alcohols on Gold
5:30 pm Michael Shur, Rensselaer Polytechnic Institute
Counterintuitive Physics of Ballistic Transport in the Nanoscale State-of-the-Art Electronic Device
Closing Remarks: Keibock Lee, Park Systems
5:45pm – 7:00pm Cocktail Reception, Park Nanoscience Center, NanoFab East, Suite 1100
Day Two, Wednesday, November 20, 2019
Park Nanoscience Center, NanoFab East, Suite 1100
Atomic Force Microscope Hands-on Workshop & Demo
9:00 am Networking Breakfast
10:00 am Introduction to AFM – Auto mode, topography and nanomechanical
11:00 am AFM Demo #1
12:00 pm Lunch
1:00 pm Advanced AFM Methods – Power scripting, SICM
2:00 pm AFM Demo #2
3:00 pm Hands-on Demos – Special requests, attendee sample runs, guided use of AFMs

NSSUS 2018 lectures on-demand

Watch Keynotes and Sessions on SPM



Functional Graphene Oxide (GO) Templated Patterning and Anti-Microbial Properties

 

Dr. Rigoberto Advincula
Case Western Reserve University



Measurement Challenges arising from New Semiconductor
Materials and Structures for Integrated Circuits

 

Dr. Alain Diebold
SUNY Polytechnic Institute




Ultrathin layered materials studied by AFM and MFM

 

Dr. Gwo Ching Wang
Rensselaer Polytechnic Institute



Meeting the Challenges in Analyzing State-of-the-art Semiconductor Devices Using Scanning Probe Microscopy

 

Phil Kaszuba
Global Foundries




When glancing angle deposition meets with colloidal lithography …

 

Dr. Yiping Zhao
University of Georgia



Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires

 

Dr. Ye Tao
Rowland Institute at Harvard




Quantitative Thermal Conductivity Analysis with Scanning Thermal Microscopy

 

Dr. Jiahua Zhu
University of Akron



The Complex Polymers Beneath Your Feet

 

Dr. Nancy A. Burnham
Worcester Polytechnic Institute


Oral Presentations



2D Materials in Real and Reciprocal Spaces:
Complimentary AFM and RHEED Studies

 

Yu Xiang
RPI



van der Waals epitaxy of antimony on single-crystalline graphene

 

Xin Sun
RPI




Quasi van der Waals epitaxy of copper thin film on monolayer graphene buffer

 

Zonghuan Lu
RPI



Position-Specific Attachment of Nanoscale Samples

 

Kai Trepka
Harvard




Investigation of “Artifact” Phenomenon in Scanning Thermal Microscopy (SThM)

 

Yifan Li
University of Akron



A Suspended Graphene Sample Stage for Magnetic Resonance Force Microscopy

 

Calder Miller
Rowland Institute at Harvard

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